- 专利标题: Method, apparatus, and program for judging grid quality
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申请号: US15350097申请日: 2016-11-13
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公开(公告)号: US10275647B2公开(公告)日: 2019-04-30
- 发明人: Satoshi Naito
- 申请人: FUJIFILM Corporation
- 申请人地址: JP Tokyo
- 专利权人: FUJIFILM Corporation
- 当前专利权人: FUJIFILM Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: JCIPRNET
- 优先权: JP2015-224672 20151117
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G21K1/00 ; G06K9/03 ; G06K9/46 ; G06K9/52 ; G06T7/00
摘要:
An image obtaining section obtains a radiation image that includes a periodic pattern of a grid. A frequency analyzing section performs frequency analysis on the radiation image to obtain a frequency spectrum of the radiation image. A peak determining section determines a peak within the frequency spectrum to be a target of processing. A first judging section measures the width of the peak which is the target of processing, and judges the quality of the grid based on the measured width of the peak.
公开/授权文献
- US20170140203A1 METHOD, APPARATUS, AND PROGRAM FOR JUDGING GRID QUALITY 公开/授权日:2017-05-18
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