Invention Grant
- Patent Title: Object analyzing method and object analyzing system
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Application No.: US15196054Application Date: 2016-06-29
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Publication No.: US10275868B2Publication Date: 2019-04-30
- Inventor: Chun-Chia Chen , Liang-Che Sun
- Applicant: MEDIATEK INC.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agent Winston Hsu
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/62

Abstract:
An object analyzing method applied to an object analyzing system. The object analyzing method comprises: (a) applying at least one analyzing parameter extracting process according to an object type for an target object, to extract at least one analyzing parameter for the target object; (b) selecting least one analyzing model according to the object type; and (c) applying the analyzing model selected in the step (b), to analyze the analyzing parameter and accordingly generate an analyzing result.
Public/Granted literature
- US20170004380A1 OBJECT ANALYZING METHOD AND OBJECT ANALYZING SYSTEM Public/Granted day:2017-01-05
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