Invention Grant
- Patent Title: Array substrate, its manufacturing method and testing method, and display device
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Application No.: US15235945Application Date: 2016-08-12
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Publication No.: US10276456B2Publication Date: 2019-04-30
- Inventor: Yu Ji , Chengye Wu , Zhengyun Wu , Lei Feng , Bei Wang , Lei Song
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Anhui
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Anhui
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: CN201610006335 20160104
- Main IPC: H01L29/45
- IPC: H01L29/45 ; H01L21/66 ; H01L27/12 ; H01L29/786

Abstract:
The present disclosure provides an array substrate, its manufacturing method and testing method, and a display device. The array substrate includes a (Test Element Group) TEG arranged at a non-display area and including a plurality of to-be-tested elements and a plurality of testing contact electrodes configured to test the to-be-tested elements. Each of the to-be-tested elements is connected to at least two of the testing contact electrodes, and at least one of the testing contact electrodes is shared by at least two of the to-be-tested elements.
Public/Granted literature
- US20170194219A1 ARRAY SUBSTRATE, ITS MANUFACTURING METHOD AND TESTING METHOD, AND DISPLAY DEVICE Public/Granted day:2017-07-06
Information query
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