Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.