Invention Grant
- Patent Title: Method and system for simultaneously measuring surface normal vector and surface reflectance function in microscale
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Application No.: US15427821Application Date: 2017-02-08
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Publication No.: US10281396B2Publication Date: 2019-05-07
- Inventor: MinHyuk Kim , Giljoo Nam , Joo Ho Lee
- Applicant: Korea Advanced Institute of Science and Technology
- Applicant Address: KR Daejeon
- Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee: Korea Advanced Institute of Science and Technology
- Current Assignee Address: KR Daejeon
- Agency: Blank Rome LLP
- Priority: KR10-2016-0121871 20160923
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G02B21/26 ; G02B21/06 ; G01B11/24

Abstract:
Disclosed is a system for simultaneously measuring a surface normal vector and a surface reflection function in microscale. The system includes a light dome having a hemispherical-shaped structure and including LEDs to radiate light to an object placed therein; a macro lens installed camera arranged over the light dome to photograph the object through a hole formed at a center of the light dome under an environment in which a light is radiated from the light dome; an xyz micro-translation stage arranged under the light dome and configured to move in xyz-directions to adjust a focal distance between the macro lens installed camera and the object, and a measurement unit configured to control the light dome and the macro lens installed camera to obtain a microscale image, and configured to simultaneously measure a surface normal vector and a surface reflection function of the object based on the microscale image.
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