A method for determining a spatial relationship between an optoelectronic chip and an optical mount, the method may include temporarily filling, by a liquid, a gap formed between a lens of the optical mount and the optoelectronic chip, while the optical mount contacts the optoelectronic chip; inspecting an optical component of the optoelectronic chip through the lens and through the liquid that fills the gap; and determining the spatial relationship between the optoelectronic chip and the optical mount based on the outcome of the inspecting of the optical component.