Invention Grant
- Patent Title: Inspection device of display device, method of inspecting mother substrate for display device, and display device
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Application No.: US15171346Application Date: 2016-06-02
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Publication No.: US10283026B2Publication Date: 2019-05-07
- Inventor: Nobuyuki Ishige , Satoru Tomita
- Applicant: Japan Display Inc.
- Applicant Address: JP Minato-ku
- Assignee: Japan Display Inc.
- Current Assignee: Japan Display Inc.
- Current Assignee Address: JP Minato-ku
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2015-119028 20150612
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F1/16 ; G09G3/00 ; G09G3/36 ; G06F3/044
Abstract:
According to one embodiment, an inspection device of a display device, includes a first probe block which includes first probes, a probe block attachment which supports the first probe block to enable a position of the first probe block to be set variably, a signal source which supplies a signal to the first probes, and a transmission cable which connects the first probe block with the signal source.
Public/Granted literature
Information query
