Invention Grant
- Patent Title: Dual-energy ray scanning system, scanning method and inspecting system
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Application No.: US15278043Application Date: 2016-09-28
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Publication No.: US10285252B2Publication Date: 2019-05-07
- Inventor: Yu Hu , Shangmin Sun , Juan Zheng , Bicheng Liu
- Applicant: Nuctech Company Limited
- Applicant Address: CN Beijing
- Assignee: NUCTECH COMPANY LIMITED
- Current Assignee: NUCTECH COMPANY LIMITED
- Current Assignee Address: CN Beijing
- Agency: Kilpatrick Townsend & Stockton LLP
- Priority: CN201510627055 20150928
- Main IPC: G21K1/04
- IPC: G21K1/04 ; H05G1/30 ; G01V5/00 ; G01N23/083 ; G21K1/10

Abstract:
Provided is a dual-energy ray scanning system, which includes a ray source for alternately emitting a high energy ray and a low energy ray; a filter includes a low energy filtering element and a low energy transmitting element; a control device for synchronously controlling the ray source and the filter, and the low energy filtering element includes a plurality of filter sheets, the low energy transmitting element comprises a plurality of transmission sheets, the filter sheets and the transmission sheets are arranged alternately and surround the ray source to form a cavity, and the ray source is located on a central axis of the cavity.
Public/Granted literature
- US20170094762A1 DUAL-ENERGY RAY SCANNING SYSTEM, SCANNING METHOD AND INSPECTING SYSTEM Public/Granted day:2017-03-30
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