Invention Grant
- Patent Title: System fault diagnosis via efficient temporal and dynamic historical fingerprint retrieval
-
Application No.: US15490499Application Date: 2017-04-18
-
Publication No.: US10289478B2Publication Date: 2019-05-14
- Inventor: Wei Cheng , Kenji Yoshihira , Haifeng Chen , Guofei Jiang
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agent Joseph Kolodka
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; H04L12/24

Abstract:
Methods are provided for both single modal and multimodal fault diagnosis. In a method, a fault fingerprint is constructed based on a fault event using an invariant model. A similarity matrix between the fault fingerprint and one or more historical representative fingerprints are derived using dynamic time warping and at least one convolution. A feature vector in a feature subspace for the fault fingerprint is generated. The feature vector includes at least one status of at least one system component during the fault event. A corrective action correlated to the fault fingerprint is determined. The corrective action is initiated on a hardware device to mitigate expected harm to at least one item selected from the group consisting of the hardware device, another hardware device related to the hardware device, and a person related to the hardware device.
Public/Granted literature
- US20170308427A1 System Fault Diagnosis via Efficient Temporal and Dynamic Historical Fingerprint Retrieval Public/Granted day:2017-10-26
Information query