- Patent Title: Methods and apparatuses for test and cancellation of residual image
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Application No.: US15306532Application Date: 2016-01-12
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Publication No.: US10290245B2Publication Date: 2019-05-14
- Inventor: Hao Zhang , Wei Sun , Lingyun Shi , Haiwei Sun
- Applicant: BOE Technology Group Co., Ltd. , Beijing BOE Optoelectronics Technology Co., Ltd.
- Applicant Address: CN Beijing CN Beijing
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Beijing
- Agency: Westman, Champlin & Koehler, P.A.
- Priority: CN201510450701 20150728
- International Application: PCT/CN2016/070670 WO 20160112
- International Announcement: WO2017/016198 WO 20170202
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/36 ; G02F1/13 ; G02F1/1333

Abstract:
The embodiments of the present disclosure provide a method and an apparatus for test and cancellation of residual image, capable of solving the problem associated with inaccurate evaluation of residual image and difficulty in accurate modification. The method for residual image test according to the present disclosure comprises: playing a residual image test picture on a display panel; applying a first fixed level signal to a pixel electrode of the display panel; and obtaining potential information of the pixel electrode via a data line.
Public/Granted literature
- US20170178553A1 METHODS AND APPARATUSES FOR TEST AND CANCELLATION OF RESIDUAL IMAGE Public/Granted day:2017-06-22
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