Multilayer structure, device using the same, method for producing the multilayer structure, and method for producing the device
Abstract:
Provided are a novel multilayer structure that can be used to protect a device and a device using the multilayer structure. The disclosed multilayer structure is a multilayer structure including a substrate and a barrier layer stacked on the substrate. The 3% strain tension of the substrate in at least one direction is at least 2000 N/m. The barrier layer contains a reaction product (R). The reaction product (R) is a reaction product formed by a reaction at least between a metal oxide (A) and a phosphorus compound (B). In an infrared absorption spectrum of the barrier layer in a range of 800 to 1400 cm−1, a wavenumber (n1) at which maximum infrared absorption occurs is in a range of 1080 to 1130 cm−1. A metal atom constituting the metal oxide (A) is essentially an aluminum atom.
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