Invention Grant
- Patent Title: Engineering data collection from control and instrumentation systems
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Application No.: US15177792Application Date: 2016-06-09
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Publication No.: US10296515B2Publication Date: 2019-05-21
- Inventor: Abhishek Nikhra , Ramakrishnan Ganapathi , Manas Dutta , Kiran N , Ravi Kumar R , Avinash Rajan
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morris Plains
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morris Plains
- Main IPC: G06F17/30
- IPC: G06F17/30 ; G06F16/25 ; G06F16/2458 ; H04L29/06 ; G05B19/00

Abstract:
A system and method of engineering configuration data (ECD) collection for an industrial facility having a first control and instrumentation (C&I) system with first ECD using a first file format and a second C&I system with second ECD data using a second file format, and a data collection server. A first data agent has collection information regarding the first C&I system and a second data agent has collection information regarding the second C&I system. The first data agent collects the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated into one common generic data format. The first ECD and the second ECD are stored after being translated.
Public/Granted literature
- US20170357702A1 ENGINEERING DATA COLLECTION FROM CONTROL AND INSTRUMENTATION SYSTEMS Public/Granted day:2017-12-14
Information query