Invention Grant
- Patent Title: Resistive memory cell programmed by metal alloy formation and method of operating thereof
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Application No.: US15833192Application Date: 2017-12-06
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Publication No.: US10297312B1Publication Date: 2019-05-21
- Inventor: Takuya Futase
- Applicant: SANDISK TECHNOLOGIES LLC
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Agency: The Marbury Law Group, PLLC
- Main IPC: G11C13/00
- IPC: G11C13/00 ; H01L45/00 ; H01L27/24

Abstract:
A resistive memory cell includes a barrier layer containing at least one of silicon and germanium, and a metal oxide layer including an oxide of a metal element that provides a reversible chemical reaction under a bidirectional electrical bias at an interface with the barrier material layer. The reversible chemical reaction is selected from a silicidation reaction between the barrier material layer and the metal element, a germanidation reaction between the barrier material layer and the metal element, oxidation of the metal element, and reduction of the metal element.
Public/Granted literature
- US20190172532A1 RESISTIVE MEMORY CELL PROGRAMMED BY METAL ALLOY FORMATION AND METHOD OF OPERATING THEREOF Public/Granted day:2019-06-06
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