- 专利标题: Thermal transfer medium for testing device, testing device and method for producing same, and testing kit
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申请号: US15382148申请日: 2016-12-16
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公开(公告)号: US10302639B2公开(公告)日: 2019-05-28
- 发明人: Miyuki Hirata , Rie Kobayashi , Mio Akima
- 申请人: Miyuki Hirata , Rie Kobayashi , Mio Akima
- 申请人地址: JP Tokyo
- 专利权人: Ricoh Company, Ltd.
- 当前专利权人: Ricoh Company, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2015-247422 20151218; JP2016-239845 20161209
- 主分类号: G01N21/75
- IPC分类号: G01N21/75 ; G01N33/543 ; G01N33/558 ; G01N33/52
摘要:
Provided is a thermal transfer medium for a testing device, the thermal transfer medium including a support, a solid-phase reagent layer provided over the support and containing a reagent over a surface of the solid-phase reagent layer; and a protective layer provided over the solid-phase reagent layer in a manner to cover the reagent, wherein an average thickness of the protective layer is 0.5 μm or greater but 30 μm or less.
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