Invention Grant
- Patent Title: Computer-generated accurate yield map data using expert filters and spatial outlier detection
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Application No.: US14883517Application Date: 2015-10-14
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Publication No.: US10303677B2Publication Date: 2019-05-28
- Inventor: Marian Farah
- Applicant: The Climate Corporation
- Applicant Address: US CA San Francisco
- Assignee: The Climate Corporation
- Current Assignee: The Climate Corporation
- Current Assignee Address: US CA San Francisco
- Agency: Hickman Palermo Becker Bingham LLP
- Agent Malgorzata A. Kulczycka
- Main IPC: G06F16/00
- IPC: G06F16/00 ; G06F16/23 ; G06F16/248 ; G06F17/30 ; G06Q50/02

Abstract:
A method and system for decontaminating raw yield maps by combining filters with spatial outlier detectors is provided. In an embodiment, the method comprises receiving over a computer network electronic digital data comprising first yield data representing crop yields harvested from an agricultural field; applying one or more filters to the first yield data to identify, from the first yield data, first outlier data; generating first filtered data from the first yield data by removing the first outlier data from the first yield data; identifying, in the first filtered data, second outlier data representing outlier values based on one or more outlier characteristics; generating second outlier data from the first filtered data by removing the second outlier data from the first filtered data; generating and causing displaying on a mobile computing device a graphical representation of the crop yields harvested from the agricultural field using only the second outlier data.
Public/Granted literature
- US20170109395A1 COMPUTER-GENERATED ACCURATE YIELD MAP DATA USING EXPERT FILTERS AND SPATIAL OUTLIER DETECTION Public/Granted day:2017-04-20
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