In a general aspect, an integrated circuit can include a network configured to detect fault-injection attacks on the integrated circuit, the network including a plurality of optical sensors. The integrated circuit can also include a surveillance flip-flop coupled with the network, the surveillance flip-flop being configured to signal a fault when one or more optical sensors of the plurality of optical sensors changes state. The integrated circuit can further include at least one inductive winding included in the network, the at least one inductive winding being configured to generate an induced voltage that causes switching of at least one optical sensor of the plurality of optical sensors when the at least one inductive winding is subjected to an electromagnetic flux capable of causing a fault-injection in the integrated circuit.