Invention Grant
- Patent Title: Method and apparatus for measuring channel in wireless communication system
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Application No.: US15418616Application Date: 2017-01-27
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Publication No.: US10306655B2Publication Date: 2019-05-28
- Inventor: Min Sagong , Yong-Ho Cho , Ji-Yun Seol , Yeo-Hun Yun
- Applicant: Samsung Electronics Co., Ltd
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Priority: KR10-2016-0010323 20160127
- Main IPC: H04W72/04
- IPC: H04W72/04 ; H04W72/08 ; H04W74/08

Abstract:
A method for determining an uplink (UL) channel quality by a base station (BS) includes obtaining a coverage class (CC) value of a user equipment (UE), receiving a random access (RA) signal from the UE, determining an UL channel quality of a band in which the RA signal is transmitted, based on the CC value and the RA signal, and generating UL resource allocation information based on the UL channel quality and transmitting the UL resource allocation information to the UE. The BS includes a transceiver configured to obtain a CC value of a UE and to receive a RA signal from the UE, and a controller configured to determine an UL channel quality of a band in which the RA signal is transmitted, based on the CC value and the RA signal. A UE includes determines a CC value of the UE based on a DL signal.
Public/Granted literature
- US20170215197A1 METHOD AND APPARATUS FOR MEASURING CHANNEL IN WIRELESS COMMUNICATION SYSTEM Public/Granted day:2017-07-27
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