Invention Grant
- Patent Title: Circuit for testing display panel, method for testing display panel, and display panel
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Application No.: US15421123Application Date: 2017-01-31
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Publication No.: US10325535B2Publication Date: 2019-06-18
- Inventor: Xu Yang , Nana Tian , Xupeng Wang , Zhiyong Ren , Xiaoyuan Ding , Zhengyuan Huang
- Applicant: Shanghai AVIC OPTO Electronics Co., Ltd. , Tianma Micro-electronics Co., Ltd.
- Applicant Address: CN Shanghai CN Shenzhen
- Assignee: Shanghai AVIC OPTO Electronics Co., Ltd.,Tianma Micro-electronics Co., Ltd.
- Current Assignee: Shanghai AVIC OPTO Electronics Co., Ltd.,Tianma Micro-electronics Co., Ltd.
- Current Assignee Address: CN Shanghai CN Shenzhen
- Agency: Anova Law Group, PLLC
- Priority: CN201310754377 20131231
- Main IPC: G09G3/00
- IPC: G09G3/00 ; G09G3/36 ; G01R31/02

Abstract:
A method for testing a display panel includes: applying a first level signal to a first sub-pixel and a third sub-pixel of a first pixel unit and applying a second level signal to a second sub-pixel of the first pixel unit; applying the second level signal to a first sub-pixel and a third sub-pixel of a second pixel unit and applying the first level signal to a second sub-pixel of the second pixel unit; and detecting a short circuit between adjacent sub-pixels. The first level signal has a voltage polarity opposite to a voltage polarity of the second level signal. Therefore, it is ensured that any two adjacent sub-pixels have opposite voltage polarities when the short circuit between adjacent sub-pixels of the display panel is detected. The method also provides improved testing abilities to detect an open circuit in a sub-pixel.
Public/Granted literature
- US20170140688A1 CIRCUIT FOR TESTING DISPLAY PANEL, METHOD FOR TESTING DISPLAY PANEL, AND DISPLAY PANEL Public/Granted day:2017-05-18
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