Invention Grant
- Patent Title: Etching method and etching apparatus
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Application No.: US15698823Application Date: 2017-09-08
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Publication No.: US10325781B2Publication Date: 2019-06-18
- Inventor: Kazunori Shinoda , Satoshi Sakai , Masaru Izawa , Nobuya Miyoshi , Hiroyuki Kobayashi , Yutaka Kouzuma , Kenji Ishikawa , Masaru Hori
- Applicant: Hitachi High-Technologies Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2016-176198 20160909
- Main IPC: H01L21/321
- IPC: H01L21/321 ; H01L21/3213 ; H01L21/311 ; H01L21/67 ; H01L27/11556 ; H01L27/11582

Abstract:
A method for etching a titanium nitride film includes a first process of supplying reactive species, which include hydrogen and fluorine, to a base material including a titanium nitride film on at least a part of a surface, and a second process of vacuum-heating the base material to remove the surface reaction layer that is generated on the surface of the titanium nitride film in the first process.
Public/Granted literature
- US20180076051A1 ETCHING METHOD AND ETCHING APPARATUS Public/Granted day:2018-03-15
Information query
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