Invention Grant
- Patent Title: Apparatus and method for testing an automatic control device
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Application No.: US15097318Application Date: 2016-04-13
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Publication No.: US10331804B2Publication Date: 2019-06-25
- Inventor: Andreas Himmler , Matthias Klemm
- Applicant: dSPACE digital signal processing and control engineering GmbH
- Applicant Address: DE Paderborn
- Assignee: DSPACE DIGITAL SIGNAL PROCESSING AND CONTROL ENGINEERING GMBH
- Current Assignee: DSPACE DIGITAL SIGNAL PROCESSING AND CONTROL ENGINEERING GMBH
- Current Assignee Address: DE Paderborn
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102015207054 20150417
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G05B11/01 ; G05B15/02 ; G05B17/02

Abstract:
A system for testing at least a first automatic control device via a plant model includes: a first subsystem; and a second subsystem which is spatially separated from the first subsystem. The plant model comprises an executable first model code and an executable second model code. The first subsystem comprises a first time-signal processing component configured to electronically assign a first time signal (Ts1) from a global time source to a first event. The first model code is configured to provide a first calculation result based on the first event. The second subsystem comprises a second time-signal processing component configured to electronically assign a second time signal (Ts2) from the global time source to a second event. The second model code is configured to provide a second calculation result based on the second event.
Public/Granted literature
- US20160306900A1 APPARATUS AND METHOD FOR TESTING AN AUTOMATIC CONTROL DEVICE Public/Granted day:2016-10-20
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