Invention Grant
- Patent Title: Computer Aided Diagnosis (CAD) apparatus and method
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Application No.: US16138405Application Date: 2018-09-21
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Publication No.: US10332254B2Publication Date: 2019-06-25
- Inventor: Seung Woo Ryu , Seung Chul Chae , Jung Hoe Kim
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2014-0166736 20141126
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06K9/62 ; A61B8/00 ; A61B8/08 ; A61B5/00 ; A61B5/055 ; A61B6/12 ; A61B6/00 ; A61B8/14

Abstract:
Disclosed are Computer Aided Diagnosis (CAD) apparatus and method to combine information on sequential image frames and to provide a superior classification result for the ROI in the image frame. The CAD apparatus may include a Region of Interest (ROI) detector configured to detect an ROI from image frames, a categorizer configured to create groups of image frames having successive ROI sections from among the image frames based on a result of the detection, a classifier configured to classify an ROI detected from each of the image frames belonging to the groups, and a result combiner configured to combine classification results for the image frames belonging to each group from the groups and to calculate a group result for the each group.
Public/Granted literature
- US20190026892A1 COMPUTER AIDED DIAGNOSIS (CAD) APPARATUS AND METHOD Public/Granted day:2019-01-24
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