Invention Grant
- Patent Title: Methods of operating a nonvolatile memory device and the nonvolatile memory device thereof
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Application No.: US15830679Application Date: 2017-12-04
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Publication No.: US10332607B2Publication Date: 2019-06-25
- Inventor: Na-Young Choi , Il-Han Park , Seung-Hwan Song
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si, Gyeonggi-Do
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2017-0031037 20170313
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/28 ; G11C16/08 ; G06F11/10 ; G11C16/24 ; G11C29/02 ; G11C29/42 ; G11C11/56 ; G11C29/52 ; G11C16/04

Abstract:
In a method of operating a nonvolatile memory device including a memory cell array, where the memory cell array includes a plurality of pages, and each of the plurality of pages includes a plurality of nonvolatile memory cells, a first sampling read operation is performed to count a first number of memory cells in a first region of a first page selected from the plurality of pages, using a first default read voltage and a first offset read voltage, and a second sampling read operation is selectively performed to count a second number of memory cells in a second region of the first page, using the first default read voltage and a second offset read voltage, based on a comparison result of the first number and a first reference value. The second offset read voltage is different from the first offset read voltage.
Public/Granted literature
- US20180261296A1 METHODS OF OPERATING A NONVOLATILE MEMORY DEVICE AND THE NONVOLATILE MEMORY DEVICE THEREOF Public/Granted day:2018-09-13
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