Invention Grant
- Patent Title: Measurement of magnetic field gradients
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Application No.: US14856356Application Date: 2015-09-16
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Publication No.: US10338261B2Publication Date: 2019-07-02
- Inventor: Matthew E. Gann , Benjamin Dolgin , James C. Zellner , Ender E. Barillas
- Applicant: Raytheon Company
- Applicant Address: US MA Waltham
- Assignee: Raytheon Company
- Current Assignee: Raytheon Company
- Current Assignee Address: US MA Waltham
- Main IPC: G01V3/16
- IPC: G01V3/16 ; G01D18/00 ; G01R33/022 ; G01R33/00 ; G01V3/165

Abstract:
Technology for performing magnetic field gradient measurements is described. The magnetic field gradient measurements for specific positions on the Earth can be performed from a moving platform. The magnetic field gradient measurements can be identified as being affected by a level of error that exceeds a defined threshold. A correction value can be generated to compensate for the error in the magnetic field gradient measurements. The correction value can be applied to the magnetic field gradient measurements in order to obtain magnetic field gradient measurements with a reduced level of error.
Public/Granted literature
- US20170075020A1 Measurement of Magnetic Field Gradients Public/Granted day:2017-03-16
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