Invention Grant
- Patent Title: Measurement method, electronic device, and measurement system
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Application No.: US15071430Application Date: 2016-03-16
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Publication No.: US10339284B2Publication Date: 2019-07-02
- Inventor: Jianfeng Liu , Xun Shi , Huanguo Zhang , Fei Yan
- Applicant: Huawei Technologies Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee: HUAWEI TECHNOLOGIES CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Conley Rose, P.C.
- Priority: CN201310422976 20130916
- Main IPC: G06F21/30
- IPC: G06F21/30 ; G06F21/57 ; G06F9/455

Abstract:
A measurement method, an electronic device, and a measurement system where the electronic device reads, from a hardware storage device, running code and running data that are in a running process of a virtual machine manager (VMM), and generates first verification information according to the running code and the running data, and the electronic device stores the first verification information, and transmits, to a trusted data center, log information generated in a process that is from reading, by the electronic device, the running code and the running data to storing, by the electronic device, the first verification information such that the trusted data center measures the electronic device using the first verification information acquired from the electronic device and second verification information generated according to the log information.
Public/Granted literature
- US20160196415A1 Measurement Method, Electronic Device, and Measurement System Public/Granted day:2016-07-07
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