Invention Grant
- Patent Title: Device and system for measuring biometric information
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Application No.: US14809623Application Date: 2015-07-27
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Publication No.: US10342496B2Publication Date: 2019-07-09
- Inventor: Jaemin Kang , Yongjoo Kwon , Sunkwon Kim , Younho Kim , Sangyun Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2015-0015575 20150130
- Main IPC: A61B5/00
- IPC: A61B5/00 ; A61B5/0215 ; A61B5/021

Abstract:
A biometric information measuring device includes a pulse wave measuring module configured to measure pulse waves by emitting light toward a target object and sensing light reflected from the target object; a communication module configured to obtain calibration information from a remote calibration server; and a biometric information analyzing module configured to analyze biometric information based on the measured pulse waves and the calibration information. The calibration information indicates biometric information measurement variables of a plurality of subjects.
Public/Granted literature
- US20160220194A1 DEVICE AND SYSTEM FOR MEASURING BIOMETRIC INFORMATION Public/Granted day:2016-08-04
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