Invention Grant
- Patent Title: Optical Analyzer
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Application No.: US15545387Application Date: 2016-01-19
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Publication No.: US10352851B2Publication Date: 2019-07-16
- Inventor: Taichi Yuasa
- Applicant: TOPCON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: TOPCON CORPORATION
- Current Assignee: TOPCON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Xsensus LLP
- Priority: JP2015-010131 20150122
- International Application: PCT/JP2016/051366 WO 20160119
- International Announcement: WO2016/117530 WO 20160728
- Main IPC: G01N33/38
- IPC: G01N33/38 ; G01N21/359 ; G01N21/3563

Abstract:
A spectroscopic measuring device includes a halogen lamp as a light source, a lens of an irradiating system, a mirror, and a spectrometer. The lens of the irradiating optical system emits light from the halogen lamp to a measurement object. The mirror is an optical member, and the mirror is arranged coaxial with the lens and conducts detecting light between the halogen lamp and the measurement object, to the spectrometer. The spectrometer is an analyzing part and analyzes material of the measurement object on the basis of the light received via the mirror. The light from the halogen lamp to the measurement object passes through the peripheral part of the optical axis of the lens, and the light to be received by the spectrometer passes through the center part of the optical axis of the lens, at the position of the mirror.
Public/Granted literature
- US10557791B2 Optical Analyzer Public/Granted day:2020-02-11
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