Disclosed are an ESD detection apparatus and method applied to digital integrated circuit, and an integrated circuit. The apparatus includes: a check read control module, configured to initiate a read operation for a flip-flop set module; and a check calculation module, configured to receive a data value sent by the flip-flop set module according to the read operation, perform check calculation according to the data value, and determine, according to comparison of a result of the check calculation and a history check calculation result, whether an ESD overrun is present. According to the present application, a simple circuit structure is employed to detect the ESC overrun, without occupying resources of an external main controller. As such, other operations may not be affected, the efficiency is improved, and the ESD overrun may be detected in real time.