- 专利标题: Method for inspecting solar cell packages
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申请号: US15865439申请日: 2018-01-09
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公开(公告)号: US10361656B1公开(公告)日: 2019-07-23
- 发明人: Chun-Yi Chen , Yueh-Mu Lee , Hwen-Fen Hong
- 申请人: INSTITUTE OF NUCLEAR ENERGY RESEARCH, ATOMIC ENERGY COUNCIL, EXECUTIVE YUAN, R.O.C.
- 申请人地址: TW Taoyuan
- 专利权人: Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.O.C.
- 当前专利权人: Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.O.C.
- 当前专利权人地址: TW Taoyuan
- 代理机构: Rosenberg, Klein & Lee
- 主分类号: H02S50/15
- IPC分类号: H02S50/15 ; G01B11/26
摘要:
The present invention uses a power supply to splay a forward bias to a concentrating solar cell. Then the solar cell will emit red light (electroluminescence). After passing the secondary optical device packaged on the solar cell, the red light will exhibit specific light distribution. According to the light distribution, the accuracy of the packaging location of the solar cell, the forming precision of the secondary optical device, and whether the optical devices are defective can be examined.
公开/授权文献
- US20190214943A1 METHOD FOR INSPECTING SOLAR CELL PACKAGES 公开/授权日:2019-07-11
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