Invention Grant
- Patent Title: 3D camera and method of measuring transmittance using the same
-
Application No.: US15096783Application Date: 2016-04-12
-
Publication No.: US10362294B2Publication Date: 2019-07-23
- Inventor: Yongchul Cho , Myungjae Jeon , Yonghwa Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2015-0147538 20151022
- Main IPC: G01J3/00
- IPC: G01J3/00 ; H04N13/254 ; G01S17/36 ; G01S17/89 ; G01S7/481 ; G01S7/497 ; G02F1/015 ; G02F1/03

Abstract:
Provided are a three-dimensional (3D) camera including a wavelength-variable light source for directly measuring transmittance and a method of measuring the transmittance. The 3D camera includes, as well as a light source, a transmission type shutter, and an image sensor, and a wavelength-variable light source capable of irradiating a light with a variable wavelength without being thermally affected by the light source, the image sensor, and the transmission type shutter. The wavelength-variable light source may directly measure a change in transmittance by irradiating light toward the transmission type shutter while the 3D camera operates.
Public/Granted literature
- US20170118455A1 3D CAMERA AND METHOD OF MEASURING TRANSMITTANCE USING THE SAME Public/Granted day:2017-04-27
Information query