Provisioning of an electronic subscriber identity module (eSIM) to an embedded universal integrated circuit card (eUICC) is observed to acquire a captured payload. The captured payload is then used in replay test sessions. In a live test session, test equipment can be used to monitor the communication between an eSIM server and the eUICC in order to capture the payload transmitted from the eSIM server. In the live test session, the eUICC can be in a debug mode that persists an ability to generate the same keys. In the replay test sessions, the payload captured can be reused and the eUICC can regenerate the same keys to decrypt an encrypted eSIM in the payload. After an installation attempt, the eUICC can provide notifications to the test equipment. The eUICC can be stress-tested using methods described herein without consuming a large number of eSIMs from an eSIM server inventory.