- Patent Title: Apparatus and method for measuring temperature in electronic device
-
Application No.: US15092057Application Date: 2016-04-06
-
Publication No.: US10371577B2Publication Date: 2019-08-06
- Inventor: Tae-Han Jeon , Hongsig Kim , Hyungrock Jung , Kyungseok Kim , Jungkeun Park , Taegun Park , Cheolho Cheong
- Applicant: Samsung Electronics Co., LTD.
- Applicant Address: KR Yeong-gu, Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Yeong-gu, Suwon-si, Gyeonggi-do
- Agency: Cha & Reiter, LLC
- Priority: KR10-2015-0051955 20150413
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01J5/02 ; G01J5/08

Abstract:
An apparatus and method for measuring a temperature in an electronic device. An amount of light of an optical signal reflected off of an object is measured, and a size of a temperature measurement expectation area on the object based is determined based on the measured amount of light. A temperature measurement guide message is output based on a result of comparing the determined size and a reference area.
Public/Granted literature
- US20160299009A1 APPARATUS AND METHOD FOR MEASURING TEMPERATURE IN ELECTRONIC DEVICE Public/Granted day:2016-10-13
Information query