- 专利标题: Array and module calibration with delay line
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申请号: US14955728申请日: 2015-12-01
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公开(公告)号: US10371798B2公开(公告)日: 2019-08-06
- 发明人: Debra J. Tonks , Stephen M. Sparagna , William Kennedy , David A. Ringheiser , Jack Lee
- 申请人: Raytheon Company
- 申请人地址: US MA Waltham
- 专利权人: Raytheon Company
- 当前专利权人: Raytheon Company
- 当前专利权人地址: US MA Waltham
- 代理机构: Burns & Levinson, LLP
- 代理商 Joseph M. Maraia
- 主分类号: G01S7/40
- IPC分类号: G01S7/40 ; G01S13/02
摘要:
An apparatus and method for enhanced calibration of radar at the module level supports dual polarization and array calibration and alignment without the use of external test equipment. Utilizing a delay line, loop back capability at the module level allows existing receiver exciter subsystem to be used for calibration. This approach eliminates the need for manual array calibration using external RF monitor subsystem or external test antennas.
公开/授权文献
- US20170153317A1 ARRAY AND MODULE CALIBRATION WITH DELAY LINE 公开/授权日:2017-06-01
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