- 专利标题: Method for acquiring sample images for inspecting label among auto-labeled images to be used for learning of neural network and sample image acquiring device using the same
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申请号: US16262142申请日: 2019-01-30
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公开(公告)号: US10373027B1公开(公告)日: 2019-08-06
- 发明人: Kye-Hyeon Kim , Yongjoong Kim , Insu Kim , Hak-Kyoung Kim , Woonhyun Nam , SukHoon Boo , Myungchul Sung , Donghun Yeo , Wooju Ryu , Taewoong Jang , Kyungjoong Jeong , Hongmo Je , Hojin Cho
- 申请人: Stradvision, Inc.
- 申请人地址: KR Pohang
- 专利权人: STRADVISION, INC.
- 当前专利权人: STRADVISION, INC.
- 当前专利权人地址: KR Pohang
- 代理机构: Xsensus, LLP
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G06K9/62 ; G06N3/04 ; G06N3/08
摘要:
A method for acquiring a sample image for label-inspecting among auto-labeled images for learning a deep learning network, optimizing sampling processes for manual labeling, and reducing annotation costs is provided. The method includes steps of: a sample image acquiring device, generating a first and a second images, instructing convolutional layers to generate a first and a second feature maps, instructing pooling layers to generate a first and a second pooled feature maps, and generating concatenated feature maps; instructing a deep learning classifier to acquire the concatenated feature maps, to thereby generate class information; and calculating probabilities of abnormal class elements in an abnormal class group, determining whether the auto-labeled image is a difficult image, and selecting the auto-labeled image as the sample image for label-inspecting. Further, the method can be performed by using a robust algorithm with multiple transform pairs. By the method, hazardous situations are detected more accurately.
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