Method for acquiring sample images for inspecting label among auto-labeled images to be used for learning of neural network and sample image acquiring device using the same
摘要:
A method for acquiring a sample image for label-inspecting among auto-labeled images for learning a deep learning network, optimizing sampling processes for manual labeling, and reducing annotation costs is provided. The method includes steps of: a sample image acquiring device, generating a first and a second images, instructing convolutional layers to generate a first and a second feature maps, instructing pooling layers to generate a first and a second pooled feature maps, and generating concatenated feature maps; instructing a deep learning classifier to acquire the concatenated feature maps, to thereby generate class information; and calculating probabilities of abnormal class elements in an abnormal class group, determining whether the auto-labeled image is a difficult image, and selecting the auto-labeled image as the sample image for label-inspecting. Further, the method can be performed by using a robust algorithm with multiple transform pairs. By the method, hazardous situations are detected more accurately.
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