Invention Grant
- Patent Title: Method and apparatus for node to determine time to live of path
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Application No.: US15399171Application Date: 2017-01-05
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Publication No.: US10374901B2Publication Date: 2019-08-06
- Inventor: Hong Li Ge , Dong Xu , Jin Zhang , Ying Huang
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: CN201610312694 20160512
- Main IPC: G06F15/173
- IPC: G06F15/173 ; H04L12/24 ; H04L12/841 ; H04L12/26

Abstract:
A method for determining time to live (TTL) of a path of a node including receiving a routing control packet, which includes a first link quality indicating a link quality of a path from the neighbor node to a source node transmitting the routing control packet, from a neighbor node of the node, acquiring a third link quality indicating a link quality of a path from the node to the source node according to a second link quality indicating a link quality of a path from the node to the neighbor node and the first link quality, and determining the TTL of the path from the node to the source node according to the third link quality may be provided. Accordingly, the TTL of the path can be determined more accurately according to a link quality of the path, thereby contributing to ensuring performance and stability of a routing algorithm.
Public/Granted literature
- US20170331698A1 METHOD AND APPARATUS FOR NODE TO DETERMINE TIME TO LIVE OF PATH Public/Granted day:2017-11-16
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