Invention Grant
- Patent Title: Radiation source device, lithographic apparatus and device manufacturing method
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Application No.: US15037024Application Date: 2014-12-08
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Publication No.: US10379443B2Publication Date: 2019-08-13
- Inventor: Arjen Teake De Jong , Robertus Wilhelmus Veltman , Reinier Theodorus Martinus Jilisen
- Applicant: ASML Netherlands B.V.
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Priority: EP13196309 20131209
- International Application: PCT/EP2014/076851 WO 20141208
- International Announcement: WO2015/086510 WO 20150618
- Main IPC: G03F7/20
- IPC: G03F7/20 ; H05G2/00

Abstract:
A radiation source, e.g. for EUV for use in a lithographic apparatus, generates radiation by illuminating droplets of fuel with first radiation to form a plasma and collects second radiation omitted by the plasma using a collector (CO). The collector has an aperture and the fuel passes along a vertical trajectory through that aperture before being irradiated by the first radiation. In an embodiment the first radiation is directed along a beam, the final part of which is coincident with the final part of the trajectory of the fuel droplets. In an embodiment a gas flow is arranged coincident with the fuel trajectory and/or the beam of first radiation.
Public/Granted literature
- US20160252821A1 RADIATION SOURCE DEVICE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD Public/Granted day:2016-09-01
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