- 专利标题: Method and device for terminal applying offset to measurement report triggering condition
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申请号: US15574118申请日: 2016-05-16
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公开(公告)号: US10382994B2公开(公告)日: 2019-08-13
- 发明人: Gwanmo Ku , Sunghoon Jung
- 申请人: LG ELECTRONICS INC.
- 申请人地址: KR Seoul
- 专利权人: LG ELECTRONICS INC.
- 当前专利权人: LG ELECTRONICS INC.
- 当前专利权人地址: KR Seoul
- 代理机构: Lee, Hong, Degerman, Kang & Waimey
- 国际申请: PCT/KR2016/005146 WO 20160516
- 国际公布: WO2016/186409 WO 20161124
- 主分类号: H04W24/10
- IPC分类号: H04W24/10 ; H04W88/02 ; H04W24/08
摘要:
Provided are a method for a terminal applying an offset to a measurement report triggering condition in a wireless communication system, and a device supporting same. A terminal may measure the quality of a serving cell, measure the quality of a neighboring cell, compare the measurement type of the serving cell with the measurement type of the neighboring cell, and if the measurement type of the serving cell is different from the measurement type of the neighboring cell, apply an offset to a measurement report triggering condition. The measurement type may be any one of a broadband RS-SINR measurement or a narrowband RS-SINR measurement.
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