Invention Grant
- Patent Title: Skin evaluation method and skin evaluation device
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Application No.: US14572523Application Date: 2014-12-16
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Publication No.: US10383567B2Publication Date: 2019-08-20
- Inventor: Naoko Yoshida , Karin Kuroiwa
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM CORPORATION
- Current Assignee: FUJIFILM CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McGinn I.P. Law Group, PLLC.
- Priority: JP2012-137107 20120618; JP2013-112334 20130528
- Main IPC: A61B5/07
- IPC: A61B5/07 ; A61B5/00 ; A61B8/08 ; G01N21/47 ; A61B5/107

Abstract:
A profile of optical reflectance relative to a depth within a depth range from an epidermis to an upper layer of a dermis is created based on a coherence signal obtained by optical coherence tomography, an evaluation index is determined by calculating a difference between reflectance at a local minimum point and reflectance at a second local maximum point from the created profile, and skin conditions are evaluated based on the evaluation index.
Public/Granted literature
- US20150105635A1 Skin Evaluation Method and Skin Evaluation Device Public/Granted day:2015-04-16
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