Invention Grant
- Patent Title: Systems and methods for analyzing data in a non-destructive testing system
-
Application No.: US14974830Application Date: 2015-12-18
-
Publication No.: US10387237B2Publication Date: 2019-08-20
- Inventor: Michael Christopher Domke , Jason Howard Messinger , Sekhar Soorianarayanan , Thomas Eldred Lambdin , Scott Leo Sbihli
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee: GENERAL ELECTRIC COMPANY
- Current Assignee Address: US NY Schenectady
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G06F11/07
- IPC: G06F11/07 ; G05B23/00 ; G05B23/02 ; G06Q10/00

Abstract:
A collaboration system may include a non-destructive testing (NDT) inspection device that may communicate with at least one other computing device via a computing network. The computing network may communicatively couple a plurality of computing devices and the NDT inspection device may acquire inspection data, establish a communication connection to the at least one other computing device, and send the data to the at least one other computing device. There, the at least one other computing device may analyze the data. After the data is analyzed, the NDT inspection device may receive the analyzed data from the at least one other computing device.
Public/Granted literature
- US20160110243A1 SYSTEMS AND METHODS FOR ANALYZING DATA IN A NON-DESTRUCTIVE TESTING SYSTEM Public/Granted day:2016-04-21
Information query