Invention Grant
- Patent Title: Method for calibrating at least one processing element
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Application No.: US15549356Application Date: 2016-02-08
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Publication No.: US10393596B2Publication Date: 2019-08-27
- Inventor: Martin Kammerl , Konrad Senn
- Applicant: KRONES AG
- Applicant Address: DE
- Assignee: KRONES AG
- Current Assignee: KRONES AG
- Current Assignee Address: DE
- Agency: Hayes Soloway P.C.
- Priority: DE102015101769 20150206
- International Application: PCT/EP2016/052627 WO 20160208
- International Announcement: WO2016/124786 WO 20160811
- Main IPC: G01K15/00
- IPC: G01K15/00 ; B29C49/42 ; B29C49/78

Abstract:
Provided is a method for calibrating at least one processing element, in a processing station for processing plastic preforms, includes providing: a first measurement preform establishing at least one first measurement value of the measurement preform before processing by the processing station, and a second measurement value of the measurement preform is measured by the measuring element or a further measuring element before or after processing by the processing station, and using at least these two measurement values, a mathematical temperature curve, is recorded by the measuring element, wherein at least one calibration device determines a deviation of the measured temperature curve from a mathematical standard temperature curve, and eliminates this deviation at least partially by adaptation of processing parameters of the processing station.
Public/Granted literature
- US20180024013A1 Method For Calibrating At Least One Processing Element Public/Granted day:2018-01-25
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