Invention Grant
- Patent Title: Techniques for magnetometer calibration using selected measurements over time
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Application No.: US15389613Application Date: 2016-12-23
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Publication No.: US10393824B2Publication Date: 2019-08-27
- Inventor: Benjamin Tarlow , Murray Jarvis , William Morrison
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agency: Harrity & Harrity, LLP
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01R33/02

Abstract:
Certain aspects of the present disclosure generally relate to magnetometer calibration. In some aspects, a device may obtain multiple sets of magnetic field measurements corresponding to multiple local magnetic field strengths, wherein each set of magnetic field measurements is measured in association with an unknown local magnetic field strength. The device may calculate multiple error values using the multiple sets of magnetic field measurements, estimated values of the multiple local magnetic field strengths, and estimated hard iron bias values. The device may identify a set of hard iron bias values for magnetometer calibration based at least in part on comparing the multiple error values. The device may calibrate a magnetometer using the identified set of hard iron bias values.
Public/Granted literature
- US20180180683A1 TECHNIQUES FOR MAGNETOMETER CALIBRATION USING SELECTED MEASUREMENTS OVER TIME Public/Granted day:2018-06-28
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