Invention Grant
- Patent Title: First read solution for memory
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Application No.: US15921184Application Date: 2018-03-14
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Publication No.: US10394649B2Publication Date: 2019-08-27
- Inventor: Idan Alrod , Eran Sharon , Alon Eyal , Liang Pang , Evgeny Mekhanik
- Applicant: SanDisk Technologies LLC
- Applicant Address: US TX Addison
- Assignee: SanDisk Technologies LLC
- Current Assignee: SanDisk Technologies LLC
- Current Assignee Address: US TX Addison
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C29/04
- IPC: G11C29/04 ; G06F11/10 ; G11C16/04 ; G11C16/08 ; G11C16/10 ; G11C16/26 ; G11C16/34 ; G11C29/52 ; G11C11/56 ; G11C16/32

Abstract:
Techniques are provided for improving the accuracy of read operations of memory cells, where the threshold voltage of a memory cell can shift depending on when the read operation occurs. A memory cell is sensed by discharging a sense node into a bit line and detecting an amount of discharge at two sense times relative to a trip voltage. A bit of data is stored in first and second latches based on the two sense times, to provide first and second pages of data. The pages are evaluated using parity check equations and one of the pages which satisfies the most equations is selected. In another option, word line voltages are grounded and then floated to prevent coupling up of the word line. A weak pulldown to ground can gradually discharge a coupled up voltage of the word lines.
Public/Granted literature
- US20180203763A1 FIRST READ SOLUTION FOR MEMORY Public/Granted day:2018-07-19
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