This specification discloses methods and systems for implementing a chip integrated scope (i.e., chip scope (CS)), which is a feature that allows a user to scope RF signals (internally and externally to the DUT (device under test)), by using the RF receive path (including amplifier, filter, ADC, DSP) to capture and store signal traces. In some embodiments, this specification discloses methods and systems to enhance the sampling rate and resolution of these signal traces by using subsampling techniques where a post-processing merges the subsampled traces (with different phase-shifts of say, for example, 0°, 90°, 180°, and 270°) into a single trace that will appear to have a sampling rate that is higher than a pre-determined sampling rate used to collect these subsampled traces.