Invention Grant
- Patent Title: Reflectivity analysis to determine material on a surface
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Application No.: US15934722Application Date: 2018-03-23
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Publication No.: US10401286B1Publication Date: 2019-09-03
- Inventor: Jianyong Mo , Darren Vance , Di Xu , Liang Zhang
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G06T7/00 ; G06T1/00 ; G01N21/17

Abstract:
Embodiments herein relate to identifying whether a threshold amount of material is on a surface. In particular, an apparatus may have an inspection module to receive an image of a surface captured by a camera, where the surface is illuminated by a light source positioned at an angle to the surface. The apparatus may then analyze the received image to identify a measurement of light intensity of one or more portions of the surface; and determine, based on the analysis, whether each of the one or more portions of the surface includes a threshold amount of a material on the surface.
Public/Granted literature
- US20190293558A1 REFLECTIVITY ANALYSIS TO DETERMINE MATERIAL ON A SURFACE Public/Granted day:2019-09-26
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