Invention Grant
- Patent Title: Method for controlling error rate of device-specific information and program for controlling error rate of device-specific information
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Application No.: US15507105Application Date: 2015-08-20
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Publication No.: US10402248B2Publication Date: 2019-09-03
- Inventor: Yohei Hori , Kazukuni Kobara , Toshihiro Katashita , Toshihiro Matsui
- Applicant: National Institute of Advanced Industrial Science and Technology
- Applicant Address: JP Tokyo
- Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee Address: JP Tokyo
- Agency: McCormick, Paulding & Huber LLP
- Priority: JP2014-175824 20140829
- International Application: PCT/JP2015/073433 WO 20150820
- International Announcement: WO2016/031682 WO 20160303
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G09C1/00 ; H04L9/10 ; H04L9/32 ; H03K19/003
Abstract:
A method and a program capable of controlling an error rate of device-specific information are provided. Provided is the method for controlling an error rate of device-specific information, including a step S1 of: inputting each of i (i is an arbitrary natural number) challenges, j times (j is an arbitrary natural number), into a PUF mounted chip; leaving j responses intact (j′=j) or processing j responses into j′ pieces (0
Public/Granted literature
Information query
