Invention Grant
- Patent Title: Fine-grained causal anomaly inference for complex system fault diagnosis
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Application No.: US15661625Application Date: 2017-07-27
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Publication No.: US10402289B2Publication Date: 2019-09-03
- Inventor: Wei Cheng , Haifeng Chen , Guofei Jiang , Jingchao Ni
- Applicant: NEC Laboratories America, Inc.
- Applicant Address: JP
- Assignee: NEC CORPORATION
- Current Assignee: NEC CORPORATION
- Current Assignee Address: JP
- Agent Joseph Kolodka
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/22 ; G06N5/04 ; G06F17/50 ; G06N20/00

Abstract:
A computer-implemented method for diagnosing system faults by fine-grained causal anomaly inference is presented. The computer-implemented method includes identifying functional modules impacted by causal anomalies and backtracking causal anomalies in impaired functional modules by a low-rank network diffusion model. An invariant network and a broken network are inputted into the system, the invariant network and the broken network being jointly clustered to learn a degree of broken severities of different clusters as a result of fault propagations.
Public/Granted literature
- US20180067831A1 Fine-Grained Causal Anomaly Inference for Complex System Fault Diagnosis Public/Granted day:2018-03-08
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