Invention Grant
- Patent Title: Apparatus and method for classifying pattern in image
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Application No.: US15483359Application Date: 2017-04-10
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Publication No.: US10402693B2Publication Date: 2019-09-03
- Inventor: Tsewei Chen
- Applicant: CANON KABUSHIKI KAISHA
- Applicant Address: JP Tokyo
- Assignee: CANON KABUSHIKI KAISHA
- Current Assignee: CANON KABUSHIKI KAISHA
- Current Assignee Address: JP Tokyo
- Agency: Canon U.S.A., Inc. IP Division
- Priority: JP2016-082329 20160415
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/46 ; G06K9/62

Abstract:
A configuration of a pattern classification apparatus capable of implementing pattern classification is provided. The apparatus generates feature data base on an image and classifies a predetermined pattern by referring to the feature data.
Public/Granted literature
- US20170300787A1 APPARATUS AND METHOD FOR CLASSIFYING PATTERN IN IMAGE Public/Granted day:2017-10-19
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