- 专利标题: Measuring amplitude and phase response of measurement instrument with binary phase shift keying test signal
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申请号: US15144757申请日: 2016-05-02
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公开(公告)号: US10404422B2公开(公告)日: 2019-09-03
- 发明人: Edward M. Barich
- 申请人: Keysight Technologies, Inc.
- 申请人地址: US CA Santa Rosa
- 专利权人: Keysight Technologies, Inc.
- 当前专利权人: Keysight Technologies, Inc.
- 当前专利权人地址: US CA Santa Rosa
- 主分类号: H04L1/24
- IPC分类号: H04L1/24 ; H04L27/20 ; G01R23/16 ; H04B17/12 ; H04L27/233
摘要:
A system and method employ an exclusive-OR gate having a first input configured to receive an RF carrier signal having an RF carrier, and a second input configured to receive a square wave signal having a square wave frequency, to output to a signal processing channel under test a binary phase shift keying (BPSK) signal comprising the RF carrier signal modulated by the square wave signal. A digital signal processor is configured to receive from the signal processing channel in-phase (I) and quadrature-phase (Q) data produced by the signal processing channel in response to the BPSK signal, and to process the I and Q data to determine an amplitude response and phase response of the signal processing channel as a function of frequency.
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