Invention Grant
- Patent Title: Indirect photon-counting analytical X-ray detector
-
Application No.: US16047731Application Date: 2018-07-27
-
Publication No.: US10408949B2Publication Date: 2019-09-10
- Inventor: Hao Jiang , Joerg Kaercher , Roger D. Durst
- Applicant: Bruker AXS, Inc.
- Agency: Benoit-Côté Inc.
- Main IPC: G01T1/20
- IPC: G01T1/20 ; G01T1/36

Abstract:
An indirect, photon-counting X-ray detector capable of detecting the low-energy X-rays includes a scintillator screen that is directly coupled to a two-dimensional optical sensor. A signal filter receives an electrical output signal from the optical sensor and removes high intensity signal contributions therefrom that are indicative of direct interaction between said X-ray signal and said optical sensor. The scintillator screen has a sufficient thickness to ensure a high absorption of incident X-ray photons, and uses phosphor grains with a relatively small grain size. A cooling apparatus in thermal communication with the optical sensor may be used to control its temperature. The signal filter maintains a running average of changes in measured pixel output values for consecutive measurements, and replaces a measured value caused by a direct interaction event with a value equal to a previous measured value plus said running average.
Public/Granted literature
- US20190056514A1 INDIRECT PHOTON-COUNTING ANALYTICAL X-RAY DETECTOR Public/Granted day:2019-02-21
Information query