- Patent Title: Ultra-high modulus and etch selectivity boron-carbon hardmask films
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Application No.: US15233351Application Date: 2016-08-10
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Publication No.: US10418243B2Publication Date: 2019-09-17
- Inventor: Prashant Kumar Kulshreshtha , Ziqing Duan , Karthik Thimmavajjula Narasimha , Kwangduk Douglas Lee , Bok Hoen Kim
- Applicant: Applied Materials, Inc.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson + Sheridan LLP
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/033 ; H01L21/3065 ; C23C16/505 ; H01L21/02 ; C23C16/32
Abstract:
Implementations of the present disclosure generally relate to the fabrication of integrated circuits. More particularly, the implementations described herein provide techniques for deposition of boron-carbon films on a substrate. In one implementation, a method of processing a substrate is provided. The method comprises flowing a hydrocarbon-containing gas mixture into a processing volume of a processing chamber having a substrate positioned therein, wherein the substrate is heated to a substrate temperature from about 400 degrees Celsius to about 700 degrees Celsius, flowing a boron-containing gas mixture into the processing volume and generating an RF plasma in the processing volume to deposit a boron-carbon film on the heated substrate, wherein the boron-carbon film has an elastic modulus of from about 200 to about 400 GPa and a stress from about −100 MPa to about 100 MPa.
Public/Granted literature
- US20170103893A1 ULTRA-HIGH MODULUS AND ETCH SELECTIVITY BORON-CARBON HARDMASK FILMS Public/Granted day:2017-04-13
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