Invention Grant
- Patent Title: Optical characteristic measurement system and calibration method for optical characteristic measurement system
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Application No.: US16271608Application Date: 2019-02-08
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Publication No.: US10422694B2Publication Date: 2019-09-24
- Inventor: Yoshihiro Osawa , Tsutomu Mizuguchi , Munehiro Noguchi
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Osaka
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Osaka
- Agency: Studebaker & Brackett PC
- Priority: JP2015-136036 20150707
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/18 ; G01N21/27 ; G01J3/02 ; G01N21/64 ; G01N21/33 ; G01N21/35 ; G01N21/03

Abstract:
There is provided an optical characteristic measurement system that can be set up in a relatively short time and can increase a detection sensitivity. The optical characteristic measurement system includes a first measurement apparatus. The first measurement apparatus includes: a first detection element arranged in a housing; a first cooling unit at least partially joined to the first detection element that cools the detection element; and a suppression mechanism that suppresses temperature variations occurring around the detection element in the housing.
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